报告题目(英文)：Growth-Structure-Property Relationships in Advanced Materials

报告内容简介：Microstructure is central for research in advanced materials. On one hand, microstructural analysis is usually critical to understand the properties and performance of materials. On the other hand, it can also provide feedback to growth for improvement and optimisation. Therefore, microstructural analysis plays a core role in the Growth-Structure-Property relationships in advanced materials. In this presentation, I will demonstrate the role of microstructural analysis, atom probe tomography (APT) and transmission electron microscopy (TEM) in particular, in building Growth-Structure-Property relationships in (1) Superconductors, (2) Magnetic Semiconductors, (3) Semiconductor Nanowires, (4) Light Emitting Diodes, (5) Permanent Magnets, (6) Human Teeth.

报告人姓名：Rongkun Zheng

报告人简介(中文)：Rongkun Zheng obtained his BSc in Physics from Shandong University in China in 1999 and his PhD in Physics from the Hong Kong University of Science and Technology in 2004. He joined the University of Sydney in late 2004, and currently is an Associate Professor at the School of Physics. His research interest spans from Condensed Matter and Materials Physics to Microscopy and Microanalysis, with focus on the growth-Structure-Property relationships in functional materials and devices using sophisticated microscopy and microanalysis, particularly atom probe tomography (APT) and transmission electron microscopy (TEM). He has published more than 150 papers and has received over 5700 citations. He has received a number of awards, including a prestigious fellowship from the Australian Research Council, and has been regularly invited to national and international conferences in his field.

报告人单位(中文)：悉尼大学

报告人单位(英文)：University of Sydney

报告时间：2019-03-12 14:00

报告地点：宝山东区材料楼B-526

主办单位：上海大学材料学院

联系人：李文献